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Decapsulation
SEM&EDX
Probe Station Application
EMMI Application
OBIRCH Application
LC Application
IC Grinding:Positioned/None-positioned
De-Gold Bump
X-Ray Application
SAM Application
X-Ray Application
X-Ray Application

X-Ray is one of the most regular nondestructive detection tools in the semicon industry, and can be used in the

inspection of the following areas :

 


* all kinds of defects inside IC packages.

* possible defects in PCB processing.

* PCB short / open or abnormal connection.

* Ball integrality. ......

 
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