* EMMI is a failure analysis tool of high efficiency, which can detect and locate very weak emmission（visible and near infrared）and capture many kinds of current leakage lights caused by device defects and abnormity.
(Consult LC, OBIRCH contents)
* EMMI can detect device defects caused by ESD, Latch up, I/O Leakage, junction defect, hot electrons , oxide current
* Leakage detecting ability of EMMI can reach to microampere level. While LC (Liquid Crystal) Hot Spot Detection only milliampere level.